Mitutoyo

Mitutoyo FS70 Series 378 Semiconductor Inspection Microscopes

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SKU:
M-FS70S378MUFSI
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  • 50mm Travel range with 0.1mm/rev. for fine adjustment & 3.8mm/rev for coarse adjustment
  • 24mm Field no.
  • Equipped with Reflective illumination for bright field
  • All models are CE Marked
  • Models come with various loading weights ranging from 13.2 kg to 14.5kg
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Mitutoyo FS70 Series 378 Semiconductor Inspection Microscopes

Ergonomic High-Power Microscope for Semiconductor Inspection

Mitutoyo FS70 Series 378 Main Body Types


FEATURES
  • The optical system that has originally developed for the best seller FS 60 models was further enhanced for the FS70 models. It is ideal as a microscope unit of a prober station for semiconductors. (All models CE marked.)
  • The FS70L supports three types of YAG laser wavelength ranges (1064nm, 532nm and 355nm), while the FS70L4 supports two types of wavelength ranges (532nm and 266nm), thus expanding a scope of laser applications, allowing laser-cutting of thin-films used in semiconductors and liquid crystal substrates. However, Mitutoyo assumes no responsibility whatsoever for the performance and/or safety of the laser system used with Mitutoyo microscopes. a careful examination is recommended in selecting a laser-emission unit.
  • Bright field, Differential Interference Contrast (DIC) and polarized observations are standard with the FS70Z. The FS70L and FS70L4 do not support the DIC method.
  • By employing an inward revolver, the long working distance objectives provide excellent operatability.
  • An ergonomic design with superb operatability: the FS70 employs the erect-image optical system (the image in the field of view has the same orientation as the specimen) and enlarged fine focus adjustment wheel with rubber grip coarse adjustment knob.
  • Four Main Body Types:
    • FS70 - Main Body (Non-Laser) with 1X- tube lens
    • FS70Z - Main Body (Non-Laser) with 1X-2X Zoom Magnification Changer
    • FS70L - Main Body 1X for Three YAG Laser Wave lengths 1064/532/355nm*
    • S70L4 - Main Body 1X for Two Wave Length Ranges 532/266nm*

Mitutoyo FS70 Series 378 Semiconductor Inspection Microscopes


OTHER FEATURES:
  • Extra Long Working Distance Plan Apochromat Objectives
  • Laser Cutting Objectives
  • Long Working Distance Plan Objectives for IR, NIR, UV and NUV applications
  • Differential Interference Contrast (DIC) Option for Nonlaser Configurations
  • Reverse 4X Nosepiece
  • Optional Motorized 4X Centerable Nosepiece
  • Six-foot Cable Remote Intensity Control for Fiber Optic Illuminator
  • Concentric Coarse and Fine Focus –0.1mm Rev /Fine Focus
  • Manual Focus Block
  • Mitutoyo Infinity Corrected Optics

TECHNICAL DATA

Focus adjustment

Method: With concentric coarse and fine focusing wheels (right and left)

Range: 50mm travel range0.1mm/rev. for fine adjustment, 3.8mm/rev. for coarse adjustment

Trinocular tube Image: Erect image

Pupil distance: Siedentopf type, adjustment range: 51 - 76mm

Field number: 24

Tilt angle: 0º - 20º (only -TH, -THS models)

Illumination system: Reflective illumination for bright field (Koehler illumination, with aperture diaphragm)

Light source: 12V100W fiber optics, non-stepped adjustment), light guide length 1.5m, power consumption 150W

Objectives (optional): M Plan Apo-4, M Plan Apo SL, G Plan Apo


DIMENSIONS

Mitutoyo FS70Z-S & FS70Z-THS Dimension


Mitutoyo FS70L & FS70L4 Series 378 Semiconductor Inspection Microscopes Dimension


Mitutoyo FS70L & FS70L4 Series 378 Semiconductor Inspection Microscopes Dimension


Mitutoyo FS70L4-S & FS70L4-THS Series 378 Semiconductor Inspection Microscopes Dimension


Mitutoyo FS70 Series Catalog Mitutoyo FS70 Series Catalog
Mitutoyo FS70 Series 378 Semiconductor Inspection Microscopes Mitutoyo FS70 Series 378 Semiconductor Inspection Microscopes
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Brand Mitutoyo
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Mitutoyo FS70 Series 378 Semiconductor Inspection Microscopes

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